Strain Deconcentration in Thin Films Patterned with Circular Holes

نویسندگان

  • MATTHEW B. TUCKER
  • TENG LI
  • T. Li
چکیده

It is well known that a circular hole in a blanket thin film causes strain concentration near the hole edge when the thin film is under tension. The increased strain level can be as high as three times of the applied tension. Interestingly, we show that, by suitably patterning an array of circular holes in a thin film, the resulting strain in the patterned film can be decreased to only a fraction of the applied tension, even at the hole edges. The strain deconcentration in the film originates from the following deformation mechanism: while initially planar, the film patterned with circular holes elongates by deflecting out of plane, so that a large tension induces only small strains. Using finite element simulations, we investigate the effects of geometric parameters (i.e., hole size, spacing, and pattern) and loading direction on the resulting strain in patterned thin films under tension. The large deformability of the patterned film is independent of materials and length scale, and thus sheds light on a potential architecture concept for flexible electronics.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Formation of precise 2D Au particle arrays via thermally induced dewetting on pre-patterned substrates

The fabrication of precise 2D Au nanoparticle arrays over a large area is presented. The technique was based on pre-patterning of the substrate before the deposition of a thin Au film, and the creation of periodic particle arrays by subsequent dewetting induced by annealing. Two types of pre-patterned substrates were used: The first comprised an array of pyramidal pits and the second an array o...

متن کامل

Hole Nucleation and Growth in Free-Standing Polystyrene Ultrathin Films

Nucleation and growth of holes in free-standing ultrathin (<100 nm) polymer films are examined via opticalmicroscopy in order to gain a better understanding of these phenomena.Hole nucleation is quantified with a free energy barrier based on a simple capillary model. Additionally, holes are found to grow exponentially in accordance with previous studies in the literature. Ultrathin films of pol...

متن کامل

Electrical Impedance Analysis of Carbon Nanotube-Polyelectrolyte Thin Film Strain Sensors

Single wall carbon nanotubes (SWNT) are an impressive material at the center of the nanotechnology revolution; in particular, SWNT posses a unique array of physical properties including high stiffness and good chemical reactivity. SWNTs are explored for inclusion in polymer matrices to produce thin films with electrical properties that exhibit sensitivity to strain loading. A layer-by-layer (Lb...

متن کامل

Nano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy

ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...

متن کامل

Nano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy

ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2009